Cornell Type Tester

Year: 2020

There are several different methods used for the evaluation of innersprings and boxsprings, testing for measurements regarding firmness, firmness retention, durability, effect of impact etc. The Cornell Type Tester is used to test the long term capacity of bedding to resist cyclic loading. The machine consists of a double hemispherical ram head on a manually adjustable shaft. A load cell …

Mitutoyo CRYSTA-APEX S574 Profile projector

Year: 2019

This Mitutoyo CRYSTA-APEX S574 measuring machine was built in the year 2019 in Germany. It is equipped with a standalone PC with software. The machine has a Resolution of 0.0001 mm. Machine width: 1082 mm Machine depth: 1191 mm Machine height: 2185 mm Machine weight: 625 kg X-Axis Movement: 500 mm Y-Axis Movement: 700 mm Z-Axis Movement: 400 mm Workpiece …

Fluke 5502A

Year:

Multi Product Calibrator with Option SC300 The Fluke 5502A calibrator addresses common workload items like 3.5 and 4.5 digit digital multimeters and more. It comes with internal and external protection features that enable you to transport it easily and perform onsite or mobile calibration. It is ideal for metrology professionals who need a solution for calibrating low-to-medium accuracy electrical instrumentation.

Mitutoyo BRTA916 Profile projector

Year:

MITUTOYO - BRTA916 - softver: MCOSMOS v4.1 - X axis: 900 mm - Y axis: 1600 mm - Z axis: 600 mm - probe and associated controller replaced in: 2019 - new joystick from 2020

Keysight-Agilent E8663D Signal Generator

Year:

The Keysight E8663D PSG is a fully synthesized signal generator with high output power, low phase noise, and optional ramp sweep capability. Features: Signal characteristics- • 100 kHz to 3.2 or 9 GHz with .001 Hz resolution • -135 to +24 dBm typical output power with Option 1EU • Industry’s best SSB phase noise with Option UNY: -143 dBc/Hz (typ) …

Cascade Microtech/Karl Suss Probe Station PA200HS with Cascade Microtech XYZ Translation Stages + Probe Armhead (4 units)

Year:

Karl Suss Probe Station PA200HS The SUSS PA200 Semiautomatic Probe System is very stable, modular and flexible probe systems for wafers and substrates up to 200 mm (8) PA200HS Accessories: 1.Joystick, 2. Control Module 3. Transformer 4, Microscope 5. Light Source 6. Isolation Table 7. XYZ Translation Stage 8. Probe Arm 9. Optional Upgrade (Temptronics TPO3010B or TPO3500 (extended version) …

Nikon VMR-3020 NEXIV Video Measuring System

Year:

HP Z440 Workstation, Win 10, Cognex 8514, 64 bit 3D coordinate measuring sysem with Type 2 optical head Black and white camera Zoom range: 1-15X Total magnification: 36X to 540X Field of view (FOV) 4.67 x 3.5mm (36X) to 0.311 x 0.233mm (540X) laser autofocus and height measurement Stage XYZ: 300mm x 200mm x 150mm 5 step zoom magnification Minimum …

Used Karl Suss PA200

Year: 2001

Used Karl Suss Microtec + Karl SUSS Probehead PH250HF + Edmund Optic Probehead and Probe Arm DESCRIPTION The SUSS PA200 Semiautomatic Probe System is very stable, modular and flexible probe systems for wafers and substrates up to 200 mm (8). The standard ProberBench® Operating System provides ease of use and programmed automation for the most demanding analytical applications. The modular …

Metricon 2010/M Prism Coupler

Year: 2018

Index Accuracy: ±.0005 (worst case). Absolute index accuracy is limited primarily by uncertainties in determining the angle and refractive index of the measuring prism. For samples of reasonable optical quality, if a high resolution table is used and if the user is willing to perform a simple calibration procedure with each prism, absolute index accuracy of ±.0001-.0002 can be achieved. …

Universal Testing Machine (UTM)

Year: 2020

The Universal Testing Machine has been specially designed and manufactured to perform tests in both compression and tensile, without having to change the attachments. The universal measurement of firmness and hardness is based on a physical property called the indentation force deflection (IFD). It is calculated by determining the force required to deflect a test piece a percentage of its …

Rapid Conditioning Cabinet (R0013)

Year: 2020

The Rapid Conditioning Cabinet has been specially designed and manufactured to pre-condition paper samples in an approximate 30 minute period, to the standard laboratory environment conditions by using the Laboratory air as the final conditioning process, prior to physical testing. Application: During grade change or shift hand over’s, sometimes the results obtained by testers are very close or just out …

Signatone CM100 ultra stable 200mm manual prober

Year:

Signatone CM100 ultra stable 200mm manual prober with Mitutoyo microscope Signatone CM100 manual prober sn 708151 Analytical probe station with submicron resolution Manual control of wafer stage and microscope 200mm vacuum chuck course and fine platen lift Mitutoyo FS60 microscope with 5x/10x/20x/50x long working distance objectives Fiber optic power supply for microscope illumination Positioners in photo not included. Non-magnetic platen …

DataPhysics ACA50 Contact Angle Measuring Machine

Year:

Fully automatic and programmable video based measurement of static and dynamic contact angle according to the Sessile and Captive Drop Method. Multiple dosing unit holds maximum of 6 ES-A electric dosing modules. SCA-50 software package ver. 1.21 Build 74 WT200E motorized measuring stage adjustable in 3 axes. Lens mount with motorized adjustable tilt. Motorized zoom with software controlled aperture, magnification, …

Hologenix NGS 3500 Defect Detection System

Year:

Automatic Defect Detection & Classification Automated Die Inspection Precision Dimensional Metrology Critical Dimension (CD) and Overlay Metrology Automatic and Manual Operation Surface & Edge Defect Detection Texture Defect Detection (e.g. stains, etc.) Missing or Deformed Object Detection Extensive Defect Review Capability Graphic Maps & Image Archival CAD file import The NGS Series defect detection and metrology systems are designed for …

Used HP/AGILENT 4156C SEMICONDUCTOR PARAMETER ANALYZER w HP/AGILENT 41501B PULSE GENERATOR MODULE

Year:

The Keysight 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory bench top solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V, and add a low noise ground unit and dual pulse generators on the 4156C General features -Highly accurate laboratory bench top parameter analyzer for advanced device characterization -4x High-resolution SMU, 2xVSU and 2xVMU …

Used Karl SUSS Probehead PH250HF (3units) + Edmund Optic Probehead (PN37980) (1unit) and Probe Arm (Lot of 4)

Year:

The SUSS PH250HF is specially designed to meet the strict demands of high frequency probing. Its rigid design is however also useful for special requirements in analytical and production probing such as holding large area detectors for optoelectronics applications. The PH250HF has a travel range of 25mm on both the X and Y axis, and 10mm in Z. All movement …

Keysight-Agilent N5183A Signal Generator

Year:

The Keysight N5183A MXG microwave analog signal generators deliver the performance needed for broadband component manufacturing up to 40 GHz. This instrument provides ≤ 900 s frequency switching (≤600 s typically) to improve test times for applications like antenna test and manufacturing, with a small size (2RU) to better utilize rack space. Excellent power and level accuracy make the MXG …

Keysight-Agilent N9010A Tester

Year:

The Keysight N9010A is the industry's fastest economy-class signal analyzer. Its speed and accuracy, coupled with its unprecedented performance and application coverage, provides development and manufacturing engineers with the capabilities to cost-effectively troubleshoot new designs, increase manufacturing throughput, or analyze complex and time-varying signals. The Agilent EXA signal analyzer provides flexible, scalable signal analysis to budget-conscious engineers who don't want …

Keysight-Agilent 8114A Pulse Generator

Year:

Agilent / Hewlett Packard 8114A High Power Pulse Generator, 100 V / 2 A Today's telecommunications and computer systems increasingly take advantage of devices such as laser and IR diodes, EEPROMS and flash memories which operate at high voltages or currents. Fast, clean positive or negative pulses up to 100 V at frequencies up to 15 MHz User-definable limits for …

Perkin Elmer Optima 4300 DV ICP-OES

Year:

Perkin Elmer Optima 4300 DV ICP-OES This is a Pre-owned Perkin Elmer Optima 4300 DV ICP-OES. System includes: Optima 4300 DV ICP-OES PC & Cables It’s optical system offers simultaneous measurement and full wavelength (UV and visible) range coverage. Since an extended wavelength range does not have to be squeezed onto an existing detector, UV resolution and performance are not …