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Hiden Analytical has developed a fully automated surface analysis system in AutoSIMS, an innovative Secondary Ion Mass Spectrometer (SIMS) that can perform routine and repetitive analyses with unattended operation. With a fully automated XY-step and extensive support, AutoSIMS by Hiden can run hundreds of processes per day during uninterrupted 24/7 operation.
Hiden Analytical specializes in SIMS instruments for nanoscale depth profiling and quantitative surface analysis of many different sample types, from complete workstations to compact SIMS solutions. The AutoSIMS includes the same long-life oxygen source primary ion gun and MAXIM analyzer found throughout the Hiden SIMS product line, with the addition of a modular cassette sample holder and a software-driven XY sampling stage. This provides the basis for highly reliable detection of relevant surface spectra and three-dimensional (3D) depth profiles without human intervention.
The long lifetime of the ion gun ensures that a consistently high-stability beam is generated over long periods of operation, allowing the cassette holder and sample stage to provide continuous sample doses for high throughput batch analysis. Even novice operators can program the automatic surface analysis system by fine-tuning the experimental parameter matrix via a simple spreadsheet program.
AutoSIMS by Hiden Analytical
Hiden's AutoSIMS automatic surface analysis system can perform static and dynamic SIMS analysis with nanometer depth resolution independently. It can also be run in manual mode for expert users seeking to exploit the full range of technical possibilities available to them.
Fully automated and unattended SIMS analysis
Large sampling stage XY
Oxygen gun for sensitive analysis
Customizable cassette-style sample holder
Parameters can be specified via a spreadsheet.
Nanometer depth resolution
Modular maintenance for high uptime
Please note that this description may have been translated automatically. Contact us for further information.