| Manufacturer | Digital Instruments |
|---|---|
| Model | D3100AFM |
| Year | |
| Location | USA
|
The Digital Instruments D3100AFM is a specialized atomic force microscope designed for semiconductor applications and other precision nanoscale measurements. It features an X-Y imaging area of approximately 90 micrometers square, allowing for detailed surface analysis within this range. The Z range is around 6 micrometers, providing precise vertical scanning capability. The system can accommodate samples up to approximately 150 millimeters in size, making it suitable for a variety of wafer sizes and other substrates.
This model includes the Nanoscope IIIa controller, which is integral for managing the microscope's operations and data acquisition. The setup is mounted on an integrated acoustic vibration isolation table to minimize external vibrations and enhance measurement accuracy.
Visually, the equipment appears clean and well-maintained, with no visible damage to the main components. The main unit includes a metal base with various mechanical components, such as a circular platform likely intended for wafer placement. There is a white and metallic assembly featuring connectors and adjustment knobs, indicating the presence of precise mechanical controls. A black box component with attached cables is also present on the left side of the equipment.
The setup is accompanied by control units housed on a metal rack, one of which has visible dials and a fan for cooling. A computer tower is positioned under the rack, suggesting the inclusion of a dedicated processing unit for data handling and instrument control. The metal rack shows some rust or discoloration on the front edges of its shelves, which may be relevant for storage conditions.
Overall, the Digital Instruments D3100AFM offers a comprehensive solution for nanoscale surface imaging with essential components and controls included, suitable for semiconductor research and related fields.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
Dimension 3100 AFM
X-Y imaging area approx. 90um square
Z range approx. 6um
up to 150mm sample size
nanoscope IIIa controller
Integrated acoustic vibration isolation table
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
| Client type | Machinery dealer |
| Active since | 2019 |
| Offers online | 58 |
| Last activity | June 6, 2026 |
Dimension 3100 AFM
X-Y imaging area approx. 90um square
Z range approx. 6um
up to 150mm sample size
nanoscope IIIa controller
Integrated acoustic vibration isolation table
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
The Digital Instruments D3100AFM is a specialized atomic force microscope designed for semiconductor applications and other precision nanoscale measurements. It features an X-Y imaging area of approximately 90 micrometers square, allowing for detailed surface analysis within this range. The Z range is around 6 micrometers, providing precise vertical scanning capability. The system can accommodate samples up to approximately 150 millimeters in size, making it suitable for a variety of wafer sizes and other substrates.
This model includes the Nanoscope IIIa controller, which is integral for managing the microscope's operations and data acquisition. The setup is mounted on an integrated acoustic vibration isolation table to minimize external vibrations and enhance measurement accuracy.
Visually, the equipment appears clean and well-maintained, with no visible damage to the main components. The main unit includes a metal base with various mechanical components, such as a circular platform likely intended for wafer placement. There is a white and metallic assembly featuring connectors and adjustment knobs, indicating the presence of precise mechanical controls. A black box component with attached cables is also present on the left side of the equipment.
The setup is accompanied by control units housed on a metal rack, one of which has visible dials and a fan for cooling. A computer tower is positioned under the rack, suggesting the inclusion of a dedicated processing unit for data handling and instrument control. The metal rack shows some rust or discoloration on the front edges of its shelves, which may be relevant for storage conditions.
Overall, the Digital Instruments D3100AFM offers a comprehensive solution for nanoscale surface imaging with essential components and controls included, suitable for semiconductor research and related fields.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
| Client type | Machinery dealer |
| Active since | 2019 |
| Offers online | 58 |
| Last activity | June 6, 2026 |
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