Agilent Intuvo 9000 GC MS Measurement machine

Year: 2020

FAME analysis equipment. The Agilent Intuvo 9000 Gas Chromatography (GC) System is designed for fast gas chromatography and high throughput while simplifying laboratory workflow.


Used Northfield Rewinder

Year: 2013

- Date: 2013 - Model: BL-04581UW - Phase: 1 - Frequency: 60 Hz - F.L.A: 25 AMP - Supply voltage: 120 VAC

Optical Associates, Incorporated LS30/12S MID UV LIGHT SOURCE

Year: 2013

SET OF TWO OAI LAMPHOUSES ONE UP / ONE DOWN

Hioki IM3590 Measurement machine

Year: 2017

Analizator impedancji IM3590 jest zaawansowanym testerem komponentów szczególnie przydatnym do pomiarów impedancji elektrochemicznej i zawiera wiele funkcji graficznych, które są potrzebne do testowania baterii i materiałów chemicznych. The IM3590 impedance analyzer is an advanced component tester especially suited to electrochemical impedance measurements and includes a variety of graphing functions that are needed for battery and chemical material testing. Measurement modes …

TEL / CKD Corp RD-9900 Measurement machine

Year: 2007

Tokyo Electron TEL / CKD RD-9900 Air Drier Was used on a TEL P8XL Prober Year 2007

Dage 5000 Measurement machine

Year: 2005

Dage 5000 Bond Tester Sold refurbished and fully tested 2018 WP , BS, DS and other modules available in request.

Dage 4000 Measurement machine

Year:

Fully refurbished and tested Dage 4000 systems Dage4000+WP100+BS250 + BS5KG Complete working System , Fully tested. A Demo video will be provided before Shipping Other Modules available on request.

3D scanner Artec Eva

Year: 2018

3D scanner for making quick, textured, and accurate 3D models of medium-sized objects. It scans quickly, capturing precise measurements in high resolution. It is an excellent all-around solution for capturing objects of almost any kind, including objects with black and shiny surfaces. Price is including SW Atrec Studio.

Oxford Instruments X-Max 80mm2 Measurement machine

Year:

Oxford Instruments X-Max 80mm2 Large Area SDD Silicon Drift Detector Was just calibrated (April 2019).

MUSASHI SMX-350PCS-CTR-E/SC/K-1

Year: 2015

MUSASHI SMX-350PCS-CTR-E/SC/K-1

TDK AFM-15

Year: 2016

chip bonder vintage: 2016

FORCE LM-2400

Year: 2012

Vintage: 2012




Finetech FINEPLACER -96 "LAMBDA" base module + die flip & die pick up module + UV loctite

Year: ~ 2012

Base module + die flip & die pick up module + UV loctite The completely revised table top die bonding platform can be easily configured for a wide range of applications for process development or prototyping. Numerous process module options and in-field-retrofit capabilities guarantee maximum technological flexibility of the table top die bonder to protect your investment in the face …

LUCEO PARALLEX Bit error rate tester

Year: ~ 2012

Bit error rate tester PARALLEX® Platform System Modular Multifunctional Multichannel Start small - grow later .... mix various functions in one frame .... single channel - multiple channel .... everything is possible with this modular approach. Already as a single channel BERT the PARALLEX® system offers full functionality for testing high speed components. PRBS and user pattern generation and error …

HP/AGILENT 4156C Precision semiconductor parameter analyzer & 41501B dual pulse generators

Year:

Precision semiconductor parameter analyzer The Keysight 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory bench top solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V, and add a low noise ground unit and dual pulse generators on the 4156C General features  Highly accurate laboratory bench top parameter analyzer for advanced device characterization  …

Used Torque Measuring Flange

Year:

Kistler Torque Measuring Flange Type 4504A Condition: New – Open box Without original packaging Item available from: Immediately