IMS IMPACT 600 Metrology machine Hot deal

Year: 2005

- Regular calibration in 2 years period - Regular service in 1 year period - In really good condition for 18 years old device. - Last calibration 13.04.2022 Measuring system / software / hardware RENISHAW Motorised probe head: PH10T/TP20 Software: Virtual DMIS version 5.0 PC: Intel Pentium 4 500MB ram 80 GB Hardisk Windows XP Profesional 19“monitor

5,100 €

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CZ Czech Republic


Sensofar PLU-NEOX 3D Optical profiler nanometer measurement with confocal, interferometry and focus variation technology Hot deal

Year: ~ 2012

3D Optical profiler nanometer measurement with confocal, interferometry and focus variation technology SENSOFAR 3D PLU-NEOX with Motorized X-Y Stage include Kinetic System Inc. Isolation Table D120010 A QA/QC and R&D solution engineered for speed. 3D profiling to the nanometer with 3 optical technologies and the ability to measure smooth and shiny surfaces. The S Neox measures using confocal, interferometry and …

BUEHLER BETA 49-5102-230 Twin Variable Speed Grinder Polisher with Vector Power Head

Year: 2008

BUEHLER BETA - Twin Variable Speed Grinder Polisher with Vector Power Head Metallurgical Sample Prep The Buehler polisher is suitable for microscopy such as grain size and other structural analysis. The combination of a variable speed base and a head with load setting allows automated polishing of metallurgical samples suitable for microscopy such as grain size and other structural analysis. …

Laurell WS-650-23B Spinning coating machine

Year:

Spinning coating machine Spin coating involves accurately dispensing a liquid, typically photoresist, onto a substrate, typically a semiconductor wafer, then spinning to achieve a uniform, defect-free film. Laurell original, now-famous spin coater design employs the use of extremely precise rotation control coupled with a closed, fully optimized process chamber, leaving absolutely nothing to chance. The Laurell WS-650-23 B spin coater …

Nikon Inexiv vma-2520 Metrology machine

Year: 2017

The iNEXIV VMA-2520 benchtop CNC video metrology system provides a 200mm x 250mm x 200mm (X,Y,Z) measuring envelope together with wide field of view optics. Its compact design is perfect when space is at a premium. This touch probe-ready system is ideal for a wide variety of industrial measuring, inspection and quality control applications using both vision and tactile measuring. …

Jeol JFC-1600 Auto fine coating machine

Year:

Auto fine coating machine This coater, which consists of a main unit and a pump, is intended mainly to preparing specimens for SEM observation. It coats biological and other nonconductive specimens with metals, efficiently and in a short time. Features:  The cathode contains a permanent magnet to create an efficient glow discharge for sputtering.  It is possible to …

International Metrology Systems Ltd. IMS Premier 10.10.8 Metrology machine

Year: 2010

Excellent working condition, acquired new for the laboratory of a defense plant. One operator worked all the time, regular checks were carried out. The machine is entered in the state register of the SI type. CMM is connected, functional check is possible. There is technical documentation. The cost of a similar new machine from the manufacturer is more than 13 …

Hitachi S-4800 Metrology machine

Year: 2007

Metrology machine Manufacturer Hitachi Model S-4800 SEM with EDX year 2007

Hitachi S-5000H Metrology machine

Year: 1998

Metrology machine Manufacturer Hitachi Model S-5000H Year 1998

Hitachi S-5000 Metrology machine

Year: 1995

Metrology machine Manufacturer Hitachi Model S-5000 Year 1995

TEL Formula Nitride Metrology machine

Year: 2004

Manufacturer TEL Model Formula Nitride Year 2004 WAFER SIZE 12

Gaertner L115C-8 Ellipsometer

Year: 1995

Ellipsometer Manufacturer GAERTNER Model L115C-8 Year 1995

Hitachi WA200 Metrology machine

Year:

Manufacturer Hitachi Model WA200 WAFER SIZE 8" SMIFF interface Wide area scanning probe microscope

Veeco D9000 Metrology machine

Year:

Manufacturer Veeco Model D9000 Veeco D9000 fab Year 2001 SMIFF interface Fully automatic scanning probe mircroscope WAFER SIZE 8"

SMC INR-497-001 Metrology machine

Year:

SMC INR-497-001 Dual Channel Thermo Chiller Used, tested working Sold with 90-day warranty

ADVANTEST T5375 Metrology machine

Year:

Metrology machine Manufacturer ADVANTEST Model T5375 Condition Used

Hitachi - Metrology machine

Year:

Metrology machine Manufacturer Hitachi The machine is located in Ireland this extra information is standard for this model. Please always double-check the details during a visit The Hitachi Metrology machine is a cutting-edge electronics instrument designed for precision measurement and inspection applications. Renowned for its accuracy and reliability, this specific model is widely used in various industries, including electronics, automotive, …