| Manufacturer | ASML |
|---|---|
| Model | Yieldstar S-200B |
| Year | 2011 |
| Location | Germany
|
The ASML YieldStar S-200B is a precision optical overlay measurement system manufactured in 2011, designed specifically for semiconductor wafer inspection. This model is optimized for 300 mm (12 inch) wafers and is widely used in post-etching monitoring to ensure accurate overlay control during semiconductor production processes. The system utilizes an LPPS laser source with water cooling, enhancing measurement stability and accuracy.
The equipment features four black wafer holders or processing stations located on the front lower section, allowing for efficient handling and measurement of wafers. Above these holders, there is a control panel equipped with buttons and indicators, facilitating user operation and monitoring of the system's status. Additionally, the system includes an attached computer monitor and keyboard stand positioned on the left side, providing an integrated interface for data input and analysis.
The machine presents a clean and well-maintained appearance with no visible damage, suggesting careful handling and storage. Its design and components reflect its role as a standalone system for fast, high-precision overlay deviation measurements, critical for maintaining production quality in semiconductor manufacturing. This makes the ASML YieldStar S-200B a valuable asset for facilities requiring reliable overlay metrology solutions.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
Model: YieldStar S-200B
Manufacturer: ASML
Year of Manufacture: 2011
Technical Condition: As-is, where-is
Type: YieldStar
Wafer Size: 300 mm (12")
Laser Source: LPPS, water cooling
General Description: The YSS200B is an optical overlay measurement system designed for fast and highly accurate measurement of overlay deviations on 300 mm wafers. It is typically utilized for post-etching monitoring in production process control as a stand-alone system.
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
| Client type | Machinery dealer |
| Active since | 2025 |
| Offers online | 35 |
| Last activity | July 10, 2026 |
Model: YieldStar S-200B
Manufacturer: ASML
Year of Manufacture: 2011
Technical Condition: As-is, where-is
Type: YieldStar
Wafer Size: 300 mm (12")
Laser Source: LPPS, water cooling
General Description: The YSS200B is an optical overlay measurement system designed for fast and highly accurate measurement of overlay deviations on 300 mm wafers. It is typically utilized for post-etching monitoring in production process control as a stand-alone system.
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase
The ASML YieldStar S-200B is a precision optical overlay measurement system manufactured in 2011, designed specifically for semiconductor wafer inspection. This model is optimized for 300 mm (12 inch) wafers and is widely used in post-etching monitoring to ensure accurate overlay control during semiconductor production processes. The system utilizes an LPPS laser source with water cooling, enhancing measurement stability and accuracy.
The equipment features four black wafer holders or processing stations located on the front lower section, allowing for efficient handling and measurement of wafers. Above these holders, there is a control panel equipped with buttons and indicators, facilitating user operation and monitoring of the system's status. Additionally, the system includes an attached computer monitor and keyboard stand positioned on the left side, providing an integrated interface for data input and analysis.
The machine presents a clean and well-maintained appearance with no visible damage, suggesting careful handling and storage. Its design and components reflect its role as a standalone system for fast, high-precision overlay deviation measurements, critical for maintaining production quality in semiconductor manufacturing. This makes the ASML YieldStar S-200B a valuable asset for facilities requiring reliable overlay metrology solutions.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
| Client type | Machinery dealer |
| Active since | 2025 |
| Offers online | 35 |
| Last activity | July 10, 2026 |
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